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Authors: IEEE Power Electronics Society, Tay Andrew A. O.
ISBN-13: 9780780351417, ISBN-10: 078035141X
Format: Paperback
Publisher: IEEE
Date Published: April 1999
Edition: (Non-applicable)
SLIM: Third Generation Of Packaging Beyond MCM, CSP, Flipchip And Micro-Via Board Technologies | 1 | |
Trends In Assembly Processes For Miniaturised Consumer Electronics | 9 | |
Testing For Reliability - Relevant Or Misleading? | 10 | |
New Era For High Performance And Low Cost Semiconductor Packaging | 12 | |
The Mini Flex Ball-Grid-Array Chip-Scale Package | 13 | |
Fine Geometry And Fine Pitch Bumping Process | 18 | |
Chip Bumping For Rework On FCOB Assembly Line | 25 | |
Development Of Plastic Chip Scale Package For ATM Switching Systems | 30 | |
Vapor Pressure Analysis Of Popcorn Cracking In Plastic IC Packages By Fracture Mechanics | 36 | |
Thin Film Failure Using An Interface Delamination Law | 43 | |
Reliability Investigations Of Flip Chip Interconnects In FCOB And FCOG Applications By FEA | 49 | |
Parametric Finite Element Analysis Of Solder Joint Reliability Of Flip Chip On Board | 57 | |
Best Practices in Automated Underfill Dispensing | 63 | |
Eutectic Pb/Sn Solder Bump And Under Bump Metallurgy Interfacial Reactions And Adhesion | 69 | |
Flip Chip On Board Mounting Processes Using Anisotropic Conductive Adhesives And Eutectic Solder | 76 | |
The Ultra CSP Wafer Scale Package | 83 | |
The Effects Of Immersion Zincation To The Electroless Nickel Under-Bump Materials In Microelectronics Packaging | 89 | |
A Novel Method For Simultaneous Switching Noise Analysis In Electronic Packages | 95 | |
Parasitic Extraction And Performance Evaluation Of A High I/O Package | 99 | |
EBGA : High Frequency Electrical Characterization And The Influence Of Substrate Design Parameters On Package Performance | 107 | |
Via Design Optimisation For High Speed Device Packaging | 112 | |
Electrical Modeling Of Anisotropically Conductive Adhesive Interconnections For Microwave Applications | 119 | |
Laminar Convection Behaviour in Microchannels In Conventional Thermal Entry Length And Beyond | 126 | |
Cooling Solutions For A No-Air-Flow And Low-Junction-Temperature Application | 133 | |
Direct Approach To The Design Of Plate Fin Heat Sinks Stack Cooled By Forced Convection | 138 | |
Thermosphon-Cooled Bellow Liquid Heat Sink | 143 | |
Experimental Investigation On A Closed Mini-Thermosyphon | 147 | |
Boundary Element Analysis Of Delamination In IC Packages | 153 | |
Fracture-Mechanics Based Delamination Growth Prediction In The Very Small Periphery Array (VSPA) Package | 160 | |
Finite Element Analysis Of Plastic-Encapsulated Multi-Chip Packages | 170 | |
Lifetime And Damage Assessment For CSPs And Related Microelectronic Structures: Experimental Validation Plus Computer Modeling | 177 | |
Sensitivity Study Of Temperature And Strain Rate Dependent Properties On Solder Joint Fatigue Life | 184 | |
Bonding Of Gold Wire To Electrolytic And Immersion Gold-Plated FR-4 Laminates At Low Temperature | 190 | |
Novel Rework Techniques For Electronic Assemblies | 196 | |
The Vibration Characteristics Of Capillary In Wire Bonder | 202 | |
European Environmental Legislation In Electronics And Its Potential Impact On Far Eastern Suppliers | 206 | |
W. A. V. E. Technology For Wafer Level Packaging Of lcs | 214 | |
In-Situ Calibration Of Wire Bonder Ultrasonic System Using Integrated Microsensor | 219 | |
Compressible Effects In Microchannel Flows | 224 | |
The Enhanced Cooling Of IC Chip Arrays On Printed Circuit Boards | 229 | |
Thermal Transient Testing Of Packaging Without A Tester | 236 | |
A Thermal Model Of The Preheat Section In Wave Soldering | 240 | |
Heat Transfer And Flow Issues In Manifold Microchannel Heat Sinks: A CFD Approach | 246 | |
Thermal Characterization Of Electrically Conductive Adhesive Flip-Chip Joints | 251 | |
Vibration Reliability Test Of A PBGA Assembly | 258 | |
The Effect Of Reflow Condition On The Characteristics Of PBGA Solder Joint | 264 | |
Reliability Assessment Of Flip Chip On Board Connections | 269 | |
Reliability Assessment Of Transfer Molded CSP | 274 | |
Thermal Fatigue Life Prediction For Solder Joints With The Consideration Of Damage Evolution | 279 | |
Measurement Of Residual Stresses In Encapsulant Of A PQFP | 286 | |
The Influence Of Fillet Height Of A Low Modulus Die Attach On The Wirebondability Of A Plastic Package | 291 | |
Influence Of Material Combination On Warpage And Reflow Crack Resistance Of PBGA | 296 | |
Microstructural Evolution Of Low Temperature Solders In Solder Joints On A Flexible Substrate | 302 | |
Measurement On Thermal Properties Of solid Films In Electronic Packages | 308 | |
Robust Loop Parameters For Ball Neck Strength Enhancement | 313 | |
High Filler Loading Technique And Its Effects On The Reliability Of Epoxy Molding Compound | 318 | |
Recent Progress In Popcorn Performance And Cost Reduction Of QFP160 Using Ni/Pd Plated Dambar Less Leadframes | 325 | |
The Impact Of Die Attach Material On Type II Popcorn Cracking | 331 | |
Effect Of Mold Resin On Reliability In Gold-Aluminium Bonding | 338 | |
Underfill Material Requirements For Reliable Flip Chip Assemblies | 345 | |
Investigation Of The Adhesion Strength Between Molding Compound And Leadframe At Higher Temperatures | 349 | |
Rheological Analysis Of A Underfill Material | 354 | |
A Fast, Low Cost Method To Check For Moisture In Epoxy Molding Compound | 359 |