You are not signed in. Sign in.

List Books: Buy books on ListBooks.org

1998 2nd Electronic Packaging Technology Conference »

Book cover image of 1998 2nd Electronic Packaging Technology Conference by IEEE Power Electronics Society

Authors: IEEE Power Electronics Society, Tay Andrew A. O.
ISBN-13: 9780780351417, ISBN-10: 078035141X
Format: Paperback
Publisher: IEEE
Date Published: April 1999
Edition: (Non-applicable)

Find Best Prices for This Book »

Author Biography: IEEE Power Electronics Society

Book Synopsis

Table of Contents

SLIM: Third Generation Of Packaging Beyond MCM, CSP, Flipchip And Micro-Via Board Technologies1
Trends In Assembly Processes For Miniaturised Consumer Electronics9
Testing For Reliability - Relevant Or Misleading?10
New Era For High Performance And Low Cost Semiconductor Packaging12
The Mini Flex Ball-Grid-Array Chip-Scale Package13
Fine Geometry And Fine Pitch Bumping Process18
Chip Bumping For Rework On FCOB Assembly Line25
Development Of Plastic Chip Scale Package For ATM Switching Systems30
Vapor Pressure Analysis Of Popcorn Cracking In Plastic IC Packages By Fracture Mechanics36
Thin Film Failure Using An Interface Delamination Law43
Reliability Investigations Of Flip Chip Interconnects In FCOB And FCOG Applications By FEA49
Parametric Finite Element Analysis Of Solder Joint Reliability Of Flip Chip On Board57
Best Practices in Automated Underfill Dispensing63
Eutectic Pb/Sn Solder Bump And Under Bump Metallurgy Interfacial Reactions And Adhesion69
Flip Chip On Board Mounting Processes Using Anisotropic Conductive Adhesives And Eutectic Solder76
The Ultra CSP Wafer Scale Package83
The Effects Of Immersion Zincation To The Electroless Nickel Under-Bump Materials In Microelectronics Packaging89
A Novel Method For Simultaneous Switching Noise Analysis In Electronic Packages95
Parasitic Extraction And Performance Evaluation Of A High I/O Package99
EBGA : High Frequency Electrical Characterization And The Influence Of Substrate Design Parameters On Package Performance107
Via Design Optimisation For High Speed Device Packaging112
Electrical Modeling Of Anisotropically Conductive Adhesive Interconnections For Microwave Applications119
Laminar Convection Behaviour in Microchannels In Conventional Thermal Entry Length And Beyond126
Cooling Solutions For A No-Air-Flow And Low-Junction-Temperature Application133
Direct Approach To The Design Of Plate Fin Heat Sinks Stack Cooled By Forced Convection138
Thermosphon-Cooled Bellow Liquid Heat Sink143
Experimental Investigation On A Closed Mini-Thermosyphon147
Boundary Element Analysis Of Delamination In IC Packages153
Fracture-Mechanics Based Delamination Growth Prediction In The Very Small Periphery Array (VSPA) Package160
Finite Element Analysis Of Plastic-Encapsulated Multi-Chip Packages170
Lifetime And Damage Assessment For CSPs And Related Microelectronic Structures: Experimental Validation Plus Computer Modeling177
Sensitivity Study Of Temperature And Strain Rate Dependent Properties On Solder Joint Fatigue Life184
Bonding Of Gold Wire To Electrolytic And Immersion Gold-Plated FR-4 Laminates At Low Temperature190
Novel Rework Techniques For Electronic Assemblies196
The Vibration Characteristics Of Capillary In Wire Bonder202
European Environmental Legislation In Electronics And Its Potential Impact On Far Eastern Suppliers206
W. A. V. E. Technology For Wafer Level Packaging Of lcs214
In-Situ Calibration Of Wire Bonder Ultrasonic System Using Integrated Microsensor219
Compressible Effects In Microchannel Flows224
The Enhanced Cooling Of IC Chip Arrays On Printed Circuit Boards229
Thermal Transient Testing Of Packaging Without A Tester236
A Thermal Model Of The Preheat Section In Wave Soldering240
Heat Transfer And Flow Issues In Manifold Microchannel Heat Sinks: A CFD Approach246
Thermal Characterization Of Electrically Conductive Adhesive Flip-Chip Joints251
Vibration Reliability Test Of A PBGA Assembly258
The Effect Of Reflow Condition On The Characteristics Of PBGA Solder Joint264
Reliability Assessment Of Flip Chip On Board Connections269
Reliability Assessment Of Transfer Molded CSP274
Thermal Fatigue Life Prediction For Solder Joints With The Consideration Of Damage Evolution279
Measurement Of Residual Stresses In Encapsulant Of A PQFP286
The Influence Of Fillet Height Of A Low Modulus Die Attach On The Wirebondability Of A Plastic Package291
Influence Of Material Combination On Warpage And Reflow Crack Resistance Of PBGA296
Microstructural Evolution Of Low Temperature Solders In Solder Joints On A Flexible Substrate302
Measurement On Thermal Properties Of solid Films In Electronic Packages308
Robust Loop Parameters For Ball Neck Strength Enhancement313
High Filler Loading Technique And Its Effects On The Reliability Of Epoxy Molding Compound318
Recent Progress In Popcorn Performance And Cost Reduction Of QFP160 Using Ni/Pd Plated Dambar Less Leadframes325
The Impact Of Die Attach Material On Type II Popcorn Cracking331
Effect Of Mold Resin On Reliability In Gold-Aluminium Bonding338
Underfill Material Requirements For Reliable Flip Chip Assemblies345
Investigation Of The Adhesion Strength Between Molding Compound And Leadframe At Higher Temperatures349
Rheological Analysis Of A Underfill Material354
A Fast, Low Cost Method To Check For Moisture In Epoxy Molding Compound359

Subjects