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Scanning Electron Microscopy and X-ray Microanalysis » (3rd Edition)

Book cover image of Scanning Electron Microscopy and X-ray Microanalysis by Joseph Goldstein

Authors: Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin
ISBN-13: 9780306472923, ISBN-10: 0306472929
Format: Hardcover
Publisher: Springer-Verlag New York, LLC
Date Published: December 2002
Edition: 3rd Edition

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Author Biography: Joseph Goldstein

Book Synopsis

The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray spectral measurement, x-ray analysis, specimen preparation, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition. Annotation (c)2003 Book News, Inc., Portland, OR

Table of Contents

1Introduction1
2The SEM and Its Modes of Operation21
3Electron Beam-Specimen Interactions61
4Image Formation and Interpretation99
5Special Topics in Scanning Electron Microscopy195
6Generation of X-Rays in the SEM Specimen271
7X-Ray Spectral Measurement: EDS and WDS297
8Qualitative X-Ray Analysis355
9Quantitative X-Ray Analysis: The Basics391
10Special Topics in Electron Beam X-Ray Microanalysis453
11Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers537
12Specimen Preparation of Polymer Materials565
13Ambient-Temperature Specimen Preparation of Biological Material591
14Low-Temperature Specimen Preparation621
15Procedures for Elimination of Charging in Nonconducting Specimens647
Index675

Subjects