Authors: Joseph Goldstein, Dale Newbury, David Joy, Charles Lyman, Patrick Echlin
ISBN-13: 9780306472923, ISBN-10: 0306472929
Format: Hardcover
Publisher: Springer-Verlag New York, LLC
Date Published: December 2002
Edition: 3rd Edition
The basis of this textbook is a short course taught by the authors at the Lehigh Microscopy Summer School. Chapters cover electron beam-specimen interaction, image formation and interpretation, x-ray spectral measurement, x-ray analysis, specimen preparation, and procedures for elimination of charging in specimens. The CD-ROM contains more advanced discussion that is detailed and equation-rich, much of which formed the last chapter of the second edition. Annotation (c)2003 Book News, Inc., Portland, OR
1 | Introduction | 1 |
2 | The SEM and Its Modes of Operation | 21 |
3 | Electron Beam-Specimen Interactions | 61 |
4 | Image Formation and Interpretation | 99 |
5 | Special Topics in Scanning Electron Microscopy | 195 |
6 | Generation of X-Rays in the SEM Specimen | 271 |
7 | X-Ray Spectral Measurement: EDS and WDS | 297 |
8 | Qualitative X-Ray Analysis | 355 |
9 | Quantitative X-Ray Analysis: The Basics | 391 |
10 | Special Topics in Electron Beam X-Ray Microanalysis | 453 |
11 | Specimen Preparation of Hard Materials: Metals, Ceramics, Rocks, Minerals, Microelectronic and Packaged Devices, Particles, and Fibers | 537 |
12 | Specimen Preparation of Polymer Materials | 565 |
13 | Ambient-Temperature Specimen Preparation of Biological Material | 591 |
14 | Low-Temperature Specimen Preparation | 621 |
15 | Procedures for Elimination of Charging in Nonconducting Specimens | 647 |
Index | 675 |